SPC for Metrology Applications
Presenter: Dilip Shah   Length: Two days
Statistical Process Control (SPC) using control chart methods is normally thought of as manufacturing and process oriented statistical analysis tools. So, why utilize them in metrology applications? They are used in many indirect ways in metrology even when laboratory personnel do not think they are using them. When one checks their standards at a regular interval, performs intermediate checks and records the data, they are informally performing the first half function of control charts.

This workshop formalizes that approach, so useful information is derived from the data gathering exercise. Typical applications of control charts extend to:Check Standards
   • Stability Studies
   • Characterizing Drift
   • Long Term Reproducibility
   • Determining Realistic tolerances
   • Determining Measurement Uncertainties

ISO 17025:2005 section 5.9,2 of the standard states:

“Quality control data shall be analyzed and, where they are found to be outside pre-defined criteria, planned action shall be taken to correct the problem and to prevent incorrect results from being reported.”

This 2-day workshop provides useful tools on meeting several requirements of the ISO 17025 standard and provides good laboratory practices for improving the confidence of the test and calibration processes.

Seminar Outline:
Basic Statistics Introduction
Mean, Mode, Median, Range
Population and Sample Standard Deviation
Standard Deviation of the Mean
Histogram, Bell Curve, Central Limit Theorem
z, t and F distributions

SPC Methods
Types of Control Charts
Variable Charts
Attribute Charts
Decision rules for interpreting Control Chart data
SPC Applications in Metrology
Process Capability and determining risks
Gage R & R and ANOVA techniques
Using spreadsheets for SPC